DocumentCode :
2093998
Title :
Required matching accuracy of biphasic current pulse in multi-channel current mode bipolar stimulation for safety
Author :
Hosung Chun ; Yuanyuan Yang ; Lehmann, T.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Melbourne, Melbourne, VIC, Australia
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
3025
Lastpage :
3028
Abstract :
In neural stimulation, a current mode stimulation is preferred to a voltage mode stimulation, as it has more control over injecting charge into tissue. A matched biphasic current pulse is often employed in current mode stimulation. For safe neural stimulation, in other words, to ensure zero-net charge transfer (charge balance) into tissue, it is required to utilise a precisely matched biphasic current pulse. Mismatch in the biphasic current pulse causes residual charge on stimulating electrodes during stimulation, which will induce DC current flowing into tissue, possibly leading to tissue damage. In this paper, we derive mathematical expressions of the required matching accuracy on the biphasic current pulse under 4 different situations to ensure a safe neural stimulation; 1) single channel stimulation without shorting, 2) single channel stimulation with shorting, 3) multi-channel stimulation without shorting and 4) multi-channel stimulation with shorting.
Keywords :
bioelectric phenomena; biological tissues; biomedical electrodes; neurophysiology; prosthetics; safety; DC current; matched biphasic current pulse; matching accuracy; multichannel current mode bipolar stimulation; neural stimulation; prosthetic devices; residual charge; stimulating electrodes; tissue damage; voltage mode stimulation; zero-net charge transfer; Accuracy; Educational institutions; Electrodes; Retina; Safety; Tissue damage; Voltage control; Algorithms; Electric Stimulation; Electrodes, Implanted; Humans; Models, Theoretical;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346601
Filename :
6346601
Link To Document :
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