• DocumentCode
    2094324
  • Title

    Efficient development of power FETs and micromodules

  • Author

    Bastida, E.M. ; Donzelli, G.P. ; Longari, C. ; Pagani, M. ; Rasà, F. ; Scopelliti, L.

  • Author_Institution
    Alcatel-Telettra, Via Trento 30, 20059 Vimercate (MI) Italy. Fax +39-39-6080891. Phone +39-39-6864257.
  • fYear
    1993
  • fDate
    6-10 Sept. 1993
  • Firstpage
    804
  • Lastpage
    807
  • Abstract
    High performance power FETs and micromodules are now produced at Alcatel-Telettra with high yields and low costs. For obtaining these results a very efficient development procedure (here described) is used, which includes a new on wafer test as well as an original and very accurate non linear design method.
  • Keywords
    Circuit testing; Costs; Etching; FETs; MMICs; Manufacturing; Power measurement; Resists; Temperature; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1993. 23rd European
  • Conference_Location
    Madrid, Spain
  • Type

    conf

  • DOI
    10.1109/EUMA.1993.336711
  • Filename
    4136772
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2094324