Title :
Application of neural networks in the development of nonlinear error modeling and test point prediction
Author :
Han, Xiaolian ; Stenbakken, Gerard N. ; van Zuben, F.J. ; Engler, Hans
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
This paper explores a neural network approach for empirical nonlinear error modeling for systems that have a significant amount of nonlinearity, nonlinear error models require fewer parameters compared to linear models and require fewer test points to achieve the same prediction accuracy. A neural network with a five-layer structure is investigated. The test point error predictions from nonlinear modeling are compared with the results of linear modeling for an artificial nonlinear model, a circuit with nonlinearity, and an instrument with suspected nonlinearity. The nonlinear modeling shows move improvement when the data set contains more nonlinearity
Keywords :
circuit testing; error analysis; neural nets; singular value decomposition; artificial nonlinear model; data set; five-layer structure; neural networks; nonlinear error modeling; prediction accuracy; test point prediction; Circuit testing; Computer errors; Costs; Economic forecasting; Instruments; Intelligent networks; Mathematical model; NIST; Neural networks; Predictive models;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848815