• DocumentCode
    2094680
  • Title

    Adhesion strength of solder joints to Alloy 42 component leads

  • Author

    Hua, Fay ; Mei, Zequn ; Holder, Helen ; Glazer, Judy

  • Author_Institution
    Electron. Assembly Dev. Center, Hewlett-Packard Co., Palo Alto, CA, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    1110
  • Lastpage
    1116
  • Abstract
    Low adhesion strength of Sn-Pb solder joints to Alloy 42, a widely used material for electronic component lead-frame, is a well known but little studied problem in the electronic packaging and assembly industry. In this study, the adhesion strength of two lead-frame materials, Cu and Alloy 42, soldered with 63Sn-37Pb were compared in push-off tests. It was found that the adhesion to Alloy 42 is weaker than to Cu. Higher reflow temperature and longer reflow time strengthen the adhesion, but the effect is not significant in the temperature and time ranges which are practical for electronic assembly. The failure analysis indicates that the solder joints on Cu failed within the solder, while the solder joints on Alloy 42 failed by a clean separation between solder and the lead. Similarly, poor adhesion to Alloy 42 was also observed with 43Pb-43Sn-14Bi, and the problem was more severe. The push-off strength of the 43Pb-43Sn-14Bi joints on Alloy 42 leads was only 50% of 63Sn-37Pb on Cu leads
  • Keywords
    adhesion; failure (mechanical); materials testing; mechanical strength; packaging; reflow soldering; Alloy 42 component leads; PbSnBi; SnPb; adhesion strength; clean separation; electronic assembly; electronic component lead-frame; electronic packaging; failure analysis; push-off tests; reflow temperature; reflow time; solder joints; Adhesives; Assembly; Copper alloys; Electronic components; Electronics industry; Electronics packaging; Joining materials; Lead; Soldering; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606309
  • Filename
    606309