The effects of proton irradiation on coolrunner-II - CPID technology

Author

Garcia-Valderas, M. ; Portela-Garcia, M. ; Lopez-Ongil, C. ; Entrena, L. ; Martin-Ortega, A. ; de Mingo, J.R. ; Alvarez, M. ; Esteve, S. ; Rodriguez, Saul

Author_Institution

Electron. Technol. Dept., Carlos III Univ. of Madrid, Leganes, Spain

fYear

2008

fDate

10-12 Sept. 2008

Abstract

Nowadays, Complex Programmable Devices are highly demanded in space missions. In this sense, CoolRunner-II devices are very attractive due to their low-power consumption. However, there is no report on proton sensitivity for this technology until date. In this work proton irradiation tests were performed on these devices in the energy range from 6 to 63 MeV in both static and dynamic modes. The results reported allow considering these devices suitable for space applications.

Keywords

logic devices; low-power electronics; proton effects; radiation hardening (electronics); CPLD technology; CoolRunner-II; complex programmable logic devices; low-power consumption; proton irradiation; proton sensitivity; space missions; Field programmable gate arrays; Flash memory; Performance evaluation; Protons; Radiation effects; Random access memory; Sensitivity; CPLD technology; TID; proton irradiation effects; single event effect; single event upset; test facilities;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems (RADECS), 2008 European Conference on

Conference_Location

Jyvaskyla

ISSN

0379-6566

Print_ISBN

978-1-4577-0481-9

Type

conf

DOI

10.1109/RADECS.2008.5944064

Filename

5944064