• DocumentCode
    2095245
  • Title

    Thermal effects on PCB´s with connectors during solder attachment

  • Author

    Schluter, Bob ; De La Rosa, Joe ; Mattsen, Randy ; Pearsall, Kitty

  • Author_Institution
    IBM Corp., Austin, TX, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    1120
  • Lastpage
    1123
  • Abstract
    With the increasing complexity of electronic assemblies, a greater number of interconnections between electronic cards are needed. In many cases, longer and higher density connectors are being used to supply this increased number of interconnections. As such the match of the thermal expansion of the printed circuit board (PCB) to that of the connectors is becoming more critical for proper assembly. This paper explores the dimensional changes to the card assemblies as these pin-in-hole (PIH) connectors and other large components are soldered to the card during the wave solder process. The relevant characteristics of both the connectors and the FR4 material are evaluated and the contributions of the significant processing variables are discussed. This includes the dimensional changes to the PCB and the connectors around the glass transition temperature and the melting temperature of the eutectic solder used in the wave solder machine. The distortion due to asymmetrical board lay-up is discussed independently. These effects are then related to the overall flatness of the card assembly after completion of the process. In conclusion there are some recommendations to minimize these effects for specific applications
  • Keywords
    electric connectors; printed circuit accessories; printed circuit manufacture; thermal expansion; wave soldering; FR4 material; PCB; assembly; electronic card; eutectic solder; glass transition temperature; interconnection; melting temperature; pin-in-hole connector; printed circuit board; thermal effects; thermal expansion; wave solder attachment; Assembly; Connectors; Glass; Heating; Integrated circuit interconnections; Printed circuits; Soldering; Stress; Temperature; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606311
  • Filename
    606311