Title :
Noise figure measurements on nonlinear devices
Author :
Geens, Alain ; Rolain, Yves
Author_Institution :
Dept. Electr. TW, Vrije Univ., Brussels, Belgium
Abstract :
A study of the effect of a cubic nonlinearity on the Y-factor method for measuring noise figures is performed. By hypothesis, this technique does not take nonlinearities into account. It is shown that the presence of the nonlinearity largely influences the measured noise figure value. An alternative single tone noise figure measurement setup is proposed to correct the problem
Keywords :
electric noise measurement; electron device noise; nonlinear systems; Y-factor method; cubic nonlinearity; noise figure measurement; nonlinear devices; power spectal density; single tone; Bandwidth; Design methodology; Fourier transforms; Linear systems; Noise figure; Noise measurement; Nonlinear systems; Performance evaluation; System testing; Time invariant systems;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848845
