• DocumentCode
    2095382
  • Title

    Analysis of device failures in a power-combining array

  • Author

    Lin, Jenshan ; Itoh, Tatsuo

  • Author_Institution
    Department of Electrical Engineering, University of California, Los Angeles 405 Hilgard Avenue, Los Angeles, CA 90024, U.S.A.
  • fYear
    1993
  • fDate
    6-10 Sept. 1993
  • Firstpage
    912
  • Lastpage
    913
  • Abstract
    The circuit performance of a power-combining array with device degradation was analyzed. The theoretical result shows that the circuit still oscillates in the in-phase mode when the open-circuit failure occurs, while it cannot oscillate in the in-phase mode when the short-circuit failure occurs. The radiation pattern and the Effective Radiated Power(ERP) were measured to verify the theoretical analysis.
  • Keywords
    Antenna measurements; Antenna radiation patterns; Circuit optimization; Degradation; Enterprise resource planning; Failure analysis; Impedance; Performance analysis; Resistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1993. 23rd European
  • Conference_Location
    Madrid, Spain
  • Type

    conf

  • DOI
    10.1109/EUMA.1993.336747
  • Filename
    4136808
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2095382