Title :
Analysis of device failures in a power-combining array
Author :
Lin, Jenshan ; Itoh, Tatsuo
Author_Institution :
Department of Electrical Engineering, University of California, Los Angeles 405 Hilgard Avenue, Los Angeles, CA 90024, U.S.A.
Abstract :
The circuit performance of a power-combining array with device degradation was analyzed. The theoretical result shows that the circuit still oscillates in the in-phase mode when the open-circuit failure occurs, while it cannot oscillate in the in-phase mode when the short-circuit failure occurs. The radiation pattern and the Effective Radiated Power(ERP) were measured to verify the theoretical analysis.
Keywords :
Antenna measurements; Antenna radiation patterns; Circuit optimization; Degradation; Enterprise resource planning; Failure analysis; Impedance; Performance analysis; Resistors; Voltage;
Conference_Titel :
Microwave Conference, 1993. 23rd European
Conference_Location :
Madrid, Spain
DOI :
10.1109/EUMA.1993.336747
