Title :
Hardware and software simulation of transient pulse impact on integrated circuits
Author :
Korte, S. ; Camp, M. ; Garbe, H.
Author_Institution :
Inst. of Electr. Eng. & Meas. Sci., Hannover Univ., Germany
Abstract :
In this paper the destruction effects of semiconductor devices after impact of fast transient electromagnetic pulses are investigated Different logic devices like NANDs and inverter were exposed to high amplitude transient pulses. The pulses have been applied as field threats and as conducted threats. Furthermore a simulation of the destruction effects with the finite element method (FEM) has been performed.
Keywords :
electromagnetic pulse; electronic engineering computing; finite element analysis; integrated circuits; logic devices; transients; FEM; NAND; destruction effects; finite element method; integrated circuits; inverter; logic devices; semiconductor devices; transient electromagnetic pulses; Circuit simulation; EMP radiation effects; Electric breakdown; Electromagnetic measurements; Electromagnetic transients; Electromagnetic waveguides; Hardware; Magnetic field measurement; Pulse circuits; Pulse measurements;
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
DOI :
10.1109/ISEMC.2005.1513564
