Title :
Measuring mixed signal substrate coupling
Author :
Rolain, Yves ; Moer, Wendy Van ; Vandersteen, Gerd ; Van Heijningen, Marc
Author_Institution :
Dept. Electr., Vrije Univ., Brussels, Belgium
Abstract :
A measurement method is proposed to characterise the substrate coupling between digital and analog sections of a mixed signal CMOS chip. Induced noise and spurious signals are measured by a custom designed analog sensor. Calibrated sampling scope based measurements show the strength and drawbacks of the proposed approach
Keywords :
CMOS integrated circuits; calibration; electric noise measurement; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; network analysers; substrates; calibrated sampling scope; custom designed analog sensor; mixed signal CMOS chip; mixed signal substrate coupling; noise; spurious signals; Contamination; Degradation; Differential amplifiers; Integrated circuit measurements; Inverters; Oscilloscopes; Pollution measurement; Sampling methods; Semiconductor device measurement; Testing;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848854
