DocumentCode :
2095488
Title :
CTE-measurement and delamination growth by a real time Moire technique
Author :
Zou, Daqing ; Wang, Jianjun ; Yang, Wei ; Liu, Sheng
Author_Institution :
Dept. of Mech. Eng., Wayne State Univ., Detroit, MI, USA
fYear :
1997
fDate :
18-21 May 1997
Firstpage :
1124
Lastpage :
1127
Abstract :
In this study, a real time moire interferometry technique was presented. CTE (coefficient of thermal expansion) and glass transfer temperature (Tg) measurements of a molding compound were conducted with the aid of a recently developed vacuum thermal chamber and a computer imaging analysis system. This technique was also applied to the study of the thermo-mechanical deformation of a silicon/molding compound bimaterial with an interface delamination. The fringe patterns of the thermo-mechanical deformation were presented. The phase angle of the interface delamination were calculated and discussed
Keywords :
delamination; glass transition; light interferometry; moire fringes; thermal expansion measurement; thermal variables measurement; CTE measurement; coefficient of thermal expansion; computer imaging analysis system; fringe pattern; glass transition temperature; interface delamination; phase angle; real time moire interferometry; silicon/molding compound bimaterial; thermomechanical deformation; vacuum thermal chamber; Delamination; Glass; Image analysis; Interferometry; Silicon; Temperature measurement; Thermal conductivity; Thermal expansion; Thermomechanical processes; Vacuum systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1997. Proceedings., 47th
Conference_Location :
San Jose, CA
ISSN :
0569-5503
Print_ISBN :
0-7803-3857-X
Type :
conf
DOI :
10.1109/ECTC.1997.606312
Filename :
606312
Link To Document :
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