DocumentCode
2095588
Title
FDTD analysis of symmetric TEM cell
Author
Rostamzadeh, Cyrous ; Archambeault, Bruce ; Connor, Samuel
Author_Institution
Robert Bosch Corp., MI, USA
Volume
2
fYear
2005
fDate
8-12 Aug. 2005
Firstpage
525
Abstract
Traditional measurements of the electric field distribution inside a symmetric square TEM cell can be tedious, difficult and subject to errors. In this paper we evaluate a numerical FDTD method for prediction of spatial electric field distribution within an empty TEM cell. FDTD results compare favorably with measured data, hence providing an excellent tool to replace measurement methods and avoid errors. Emphasis is laid on the basic idea of field perturbation introduced by external field probes and objects, thus promoting FDTD computational techniques as an alternative but accurate, valid and a suitable tool.
Keywords
TEM cells; computational electromagnetics; electric fields; finite difference time-domain analysis; FDTD analysis; electric field distribution; external field probes; field perturbation; spatial electric field distribution; symmetric TEM cell; Cutoff frequency; Finite difference methods; Immunity testing; Impedance; Laboratories; Magnetic field measurement; Probes; Resonance; TEM cells; Time domain analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN
0-7803-9380-5
Type
conf
DOI
10.1109/ISEMC.2005.1513571
Filename
1513571
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