Title :
PEST-a tool for implementing pseudo-exhaustive self test
Author :
Wu, Eleanor ; Rutkowski, Paul W.
Author_Institution :
AT&T Bell Labs. Eng. Res. Center, Princeton, NJ, USA
Abstract :
PEST is a CAD tool for implementing pseudo-exhaustive self test in integrated circuits. PEST´s unique features are: parallel testing of all cones; global test point selection; and a new cost effective scheme for test vector generation. AT&T´s network interface controller chip was designed using PEST. Effective 100% fault coverage without fault simulation or test generation was obtained with less than 24% transistor overhead. This paper begins with an overview of PEST´s approach. The test generation algorithm is then described. Finally, the implementation of PEST in the network interface controller is presented
Keywords :
logic CAD; logic testing; CAD tool; PEST; integrated circuits; pseudoexhaustive self test; test generation algorithm; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Design automation; Flip-flops; Integrated circuit testing; Logic; Network interfaces; Vectors;
Conference_Titel :
Design Automation Conference, 1990., EDAC. Proceedings of the European
Conference_Location :
Glasgow
Print_ISBN :
0-8186-2024-2
DOI :
10.1109/EDAC.1990.136724