Title :
Low Cost Testing of Low Power Wireless Transceivers
Author :
Zhang, Larry ; Reichelt, Paal Oeyvind
Author_Institution :
Texas Instrum., Inc., Dallas
Abstract :
Parallel low cost testing of low power wireless RF transceivers is realized using a low cost RF mixed signal tester. Special design for test (DFT) considerations for the transceiver has made the implementation of low cost multisite RF testing possible with reduced test time and test development effort and improved throughput. Careful load board design considerations have reduced load board cross talk, signal noise coupling, and susceptibility for electromagnetic interference.
Keywords :
crosstalk; design for testability; radio networks; radiofrequency interference; transceivers; DFT; cross talk; electromagnetic interference; low cost RF mixed signal tester; low cost multisite RF testing; low power wireless RF transceivers; parallel low cost testing; signal noise coupling; special design for test; Costs; Design for testability; Electromagnetic interference; Noise reduction; RF signals; Radio frequency; Signal design; Testing; Throughput; Transceivers; DFT; Low Power Wireless; RF; S-Parameter; Transceiver; low cost test; multisite test;
Conference_Titel :
Consumer Electronics, 2007. ISCE 2007. IEEE International Symposium on
Conference_Location :
Irving, TX
Print_ISBN :
978-1-4244-1109-2
Electronic_ISBN :
978-1-4244-1110-8
DOI :
10.1109/ISCE.2007.4382212
