Title :
BEMD and wavelet denoising based classification for hyperspectral image
Author :
He, Zhi ; Jin, Jing ; Zhang, Miao ; Shen, Yi ; Wang, Yan
Author_Institution :
Sch. of Astronaut., Harbin Inst. of Technol., Harbin, China
Abstract :
A high-accuracy algorithm based on combination of bi-dimensional empirical mode decomposition (BEMD) and wavelet denoising is presented in this paper, in which BEMD is adapted to decompose optimal bands selected from feature selection technique into many bi-dimensional intrinsic mode functions (BIMFs) and sym4 wavelet is chosen to denoise these BIMFs, so that the denoised BIMFs could be taken as input of support vector machine (SVM). Experimental results indicate that the proposed approach not only has promising accuracy but also significantly reduces complexity and computational time of SVM.
Keywords :
image classification; image denoising; support vector machines; BEMD; bi-dimensional empirical mode decomposition; bi-dimensional intrinsic mode function; feature selection technique; hyperspectral image classification; support vector machine; wavelet denoising; Accuracy; Hyperspectral imaging; Noise reduction; Support vector machines; Training; Wavelet transforms; bi-dimensional empirical mode decomposition (BEMD); classification; feature selection; support vector machine (SVM); wavelet denoising;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location :
Binjiang
Print_ISBN :
978-1-4244-7933-7
DOI :
10.1109/IMTC.2011.5944098