Title :
Edge detection and automatic threshold based on wavelet transform in the VPPAW keyhole image processing
Author :
Liu, Zhonghua ; Wang, Qilong
Author_Institution :
Welding Dept., Harbin Inst. of Technol., China
Abstract :
In order to realize the feedback control for variable polarity plasma are weld (VPPAW) formation in the weld process, the geometrical sizes of the keyhole image must be extracted. With the properties of multiscale edge through the wavelet theory, the edge points were detected by getting the maximum modulus of the gradient vector in the direction towards which the gradient vector points in the image plane. At coarse scales, the local maxima of modules have different positions and only detected the sharp edge. At fine scale, there are many maxima created by the image noise. We must integrate this multiscale information to look for the best scale where the edges are well discriminated from noises. At last, A new method of peak analysis for threshold selection is provided. It is based on the wavelet transform which provides a multiscale analysis of the information of the histogram. Many experiments show these ways are effective for the keyhole image to get the geometry parameters of the keyhole in the real-time image processing
Keywords :
arc welding; computer vision; curve fitting; edge detection; feedback; plasma materials processing; wavelet transforms; VPPAW keyhole image processing; automatic threshold; curve fitting; feedback control; geometrical sizes; geometry parameters; gradient vector; maximum modulus; multiscale edge detection; peak analysis; real-time image processing; threshold selection; variable polarity plasma; wavelet transform; weld process; Feedback control; Geometry; Histograms; Image edge detection; Information analysis; Plasma properties; Plasma waves; Plasma welding; Wavelet analysis; Wavelet transforms;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-5890-2
DOI :
10.1109/IMTC.2000.848894