Title :
Impersonal Probability Assessment of Equipment Trip Probability Due to Voltage Sag
Author :
Wang, Ying ; Huang, Yong ; Ma, Chao ; Xiao, Xianyong
Author_Institution :
Coll. of Electr. Eng. & Inf. Technol., Sichuan Univ., Chengdu, China
Abstract :
The assessment of equipment trip probability due to voltage sag is a complicated matter because of the uncertainties both from voltage sag in power systems and sensitive equipment in customer side. The uncertainties of influencing factors are difficult to determine especially the stochastic distribution of voltage tolerance of equipment. The characteristics of voltage sag are determined by sag severity indices and the probability density function of voltage tolerance of equipment is determined by maximum entropy model. An impersonal assessment method is proposed in this paper. As a case study, PC is simulated and the simulation results are compared with the current methods.
Keywords :
entropy; power supply quality; power system faults; probability; stochastic processes; equipment trip probability; impersonal probability assessment; maximum entropy model; probability density function; sag severity index; stochastic distribution; voltage sag; voltage tolerance; Chaos; Educational institutions; Entropy; Information technology; Probability; Programmable control; Stochastic processes; Uncertainty; Variable speed drives; Voltage fluctuations;
Conference_Titel :
Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4812-8
Electronic_ISBN :
978-1-4244-4813-5
DOI :
10.1109/APPEEC.2010.5448535
