DocumentCode
2096454
Title
A composite system design methodology for instrumentation and embedded system
Author
Alippi, Cesare ; Bertoni, Guido M. ; Diani, Gian Marco ; Piuri, Vincenzo ; Scotti, Fabio
Author_Institution
Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
Volume
2
fYear
2000
fDate
2000
Firstpage
1086
Abstract
Surely, the main goal when designing an embedded system is performance maximization. Nevertheless, physical constraints such as silicon area and/or power consumption take and active part in the system design by limiting, most of time, the solution space and hence reducing the system performance. In this paper we present a methodology for selecting the best composite model for an embedded system in a constrained environment. The envisaged constraints are computational complexity and latency which respectively address the computational complexity issue in SW and HW realizations, respectively. It is assumed that the algorithm to be implemented in the embedded system is not given and must be constructed by relying on some (input, output) examples. Models considered for the system identification phase can be linear (e.g., ARMAX), nonlinear (e.g., neural based models) or composite (a suitable mix of linear and nonlinear models). The best solution is then selected from the candidate ones to optimally satisfy the application requirements
Keywords
CAD; computational complexity; computerised instrumentation; constraint handling; embedded systems; engineering computing; identification; power consumption; ARMAX; best composite model; composite system design; computational complexity; constrained environment; embedded system; fuel injection; instrumentation; latency; linear models; naval engine; neural based models; nonlinear models; performance maximization; power consumption; silicon area; system identification; Computational complexity; Delay; Design methodology; Embedded system; Energy consumption; Instruments; Interconnected systems; Power system modeling; Silicon; System performance;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2000. IMTC 2000. Proceedings of the 17th IEEE
Conference_Location
Baltimore, MD
ISSN
1091-5281
Print_ISBN
0-7803-5890-2
Type
conf
DOI
10.1109/IMTC.2000.848917
Filename
848917
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