Title :
On the prediction of near-field microcontroller emission
Author :
Sicard, E. ; Boyer, A. ; Tankielun, A.
Author_Institution :
INSA, Toulouse, France
Abstract :
This paper details a predictive approach for the evaluation of the magnetic field radiated by microcontrollers. The simulation is based on the radiation of elementary current dipoles corresponding to the current flowing in supply inductances. A CMOS test chip including six microcontroller cores has been scanned for validation purpose. Preliminary comparison show interesting similarities between measured and simulated scan, which build a valuable link between electrical macro-models and near-field electromagnetic formulations.
Keywords :
CMOS digital integrated circuits; integrated circuit testing; magnetic fields; microcontrollers; CMOS test chip; electrical macromodels; elementary current dipoles; magnetic field radiation; near-field microcontroller emission; predictive approach; Circuit simulation; IEC standards; Integrated circuit modeling; Logic testing; Magnetic field measurement; Microcontrollers; Noise figure; Noise measurement; Semiconductor device measurement; TEM cells;
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
DOI :
10.1109/ISEMC.2005.1513613
