• DocumentCode
    2097003
  • Title

    Comparison of the Mason and KLM equivalent circuits for piezoelectric resonators in the thickness mode

  • Author

    Sherrit, Stewart ; Leary, Sean P. ; Dolgin, Benjamin P. ; Bar-Cohen, Yoseph

  • Author_Institution
    Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    921
  • Abstract
    The parameters of the KLM and Mason´s equivalent circuits in the thickness mode are presented to include dielectric, elastic and piezoelectric loss. The models are compared under various boundary conditions with and without acoustic layers to the analytical solutions of the wave equation. We show that in all cases equivalence is found between the analytical solution and the KLM and Mason´s equivalent circuit models. It is noted that in order to maintain consistency with the linear equations of piezoelectricity and the wave equation care is required when applying complex coefficients to the models. The effect of the piezoelectric loss component on the power dissipated in the transducer is presented for loaded and unloaded transducers to determine the significance of the piezoelectric loss to transducer designers. The effect of the piezoelectric loss on the insertion loss was found to be small
  • Keywords
    crystal resonators; equivalent circuits; piezoelectric transducers; KLM equivalent circuit; Mason equivalent circuit; acoustic layer; boundary condition; dielectric loss; elastic loss; insertion loss; piezoelectric loss; piezoelectric resonator; piezoelectric transducer; power dissipation; thickness mode; wave equation; Acoustic transducers; Acoustic waves; Capacitance; Dielectric losses; Equivalent circuits; Insertion loss; Partial differential equations; Piezoelectric materials; Piezoelectric transducers; Piezoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
  • Conference_Location
    Caesars Tahoe, NV
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-5722-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1999.849139
  • Filename
    849139