• DocumentCode
    2097317
  • Title

    Study of electromagnetic interference from a high power copper vapor laser

  • Author

    Gayen, Arun ; Das, B.N. ; Poddar, D.R.

  • Author_Institution
    Dept. of E&ECE, LIT Kharagpur, India
  • Volume
    3
  • fYear
    2005
  • fDate
    8-12 Aug. 2005
  • Firstpage
    847
  • Abstract
    The copper-vapor laser (CVL) is a high power pulsed-electric discharge pumped laser. The laser lases in copper vapor media By heating the copper pieces to evaporation temperature (∼1500 °C), copper vapors are generated in the laser head. The thermal energy required for heating the copper metal to vaporization is supplied through the excitation pulse. The discharge excitation is at a rate between 2 to 20 kHz. A pulse power supply unit (PPSU) generates the high voltage pulse (electrical pulse having voltage of the order of 15 to 20 kV at 1 to 2 kA for duration of ∼600 nS), which is obtained by using a resonant charging circuit. Thus the PPSU generates power of the order of Megawatt (∼20 MW). Hence the power supply unit along with the high voltage (HV) cable carrying the electrical pulse to the laser head is a source of electromagnetic interference (EMI). In addition the laser head where the discharge takes place is also a source of electromagnetic noise. The paper presents a study of electromagnetic interference from a high power copper vapor laser system.
  • Keywords
    copper; discharges (electric); electromagnetic interference; gas lasers; 1 to 2 kA; 15 to 20 kV; EMI; discharge excitation; electromagnetic interference; electromagnetic noise; high voltage cable; power copper vapor laser; pulse excitation; pulse power supply unit; pulsed-electric discharge pumped laser; resonant charging circuit; thermal energy; Copper; Electromagnetic interference; Laser excitation; Laser noise; Optical pulses; Power lasers; Pulse circuits; Pulsed power supplies; Pump lasers; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
  • Print_ISBN
    0-7803-9380-5
  • Type

    conf

  • DOI
    10.1109/ISEMC.2005.1513643
  • Filename
    1513643