• DocumentCode
    2097431
  • Title

    Research to Improve the Forward Temperature Coefficient of FRD

  • Author

    Wu, Zhenxing ; Wu, Yu ; Jia, Yunpeng ; Tian, Feifei ; Liu, Yin ; Liu, Yueyang

  • Author_Institution
    Lab. of Power Semicond. Devices & Ics, Beijing Univ. of Technol., Beijing, China
  • fYear
    2010
  • fDate
    28-31 March 2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    The fast recovery diodes (FRDs) are widely used in high frequency and high power applications. The forward characteristics of the FRDs, such as the forward voltage drop, are very important to determine the property of the FRDs. The forward characteristics of the FRD always greatly depend on the temperature. Here, in this paper, we researched some FRDs with special structures by simulation and proposed a new structure to farther improve the temperature coefficient of the FRDs. It is found that, a diode with low P+ emitter efficiency, and a P+ buried layer at anode junction has a better forward temperature coefficient. It proposes a guiding way to design the FRDs which are worked in the positive temperature coefficient (PTC) area.
  • Keywords
    anodes; diodes; temperature; anode junction; fast recovery diodes; forward temperature coefficient; forward voltage drop; positive temperature coefficient; simulation; Anodes; Doping; Frequency; Impurities; Lattices; Low voltage; Power semiconductor devices; Semiconductor diodes; Semiconductor process modeling; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4812-8
  • Electronic_ISBN
    978-1-4244-4813-5
  • Type

    conf

  • DOI
    10.1109/APPEEC.2010.5448583
  • Filename
    5448583