DocumentCode :
2097920
Title :
Broadband suppression of SSN and radiated emissions using high-DK thin film EBG power distribution network for high-speed digital PCB applications
Author :
Lee, Junho ; Kim, Hyungsoo ; Kim, Joungho
Author_Institution :
Div. of Electr. Eng. & Comput. Sci., KAIST, Daejeon, South Korea
Volume :
3
fYear :
2005
fDate :
8-12 Aug. 2005
Firstpage :
967
Abstract :
In this paper, the great advantages of a high dielectric constant thin film EBG power distribution network (PDN) for the suppression of power/ground noises and radiated emissions in high-performance multi-layer digital PCBs were experimentally demonstrated. Five-layer test PCBs were fabricated and their self PDN impedance and S21 measured. The power plane noises and radiated emissions were measured, investigated and related to the PDN impedance. This successfully demonstrated that the band-gap of the EBG was extended more than three times, covering a range from 300 MHz to 3.6 GHz using feasible EBG cell size (1 cm × 1 cm), the power plane noise was reduced greatly over a broadband spectrum including hundreds of MHz range and the radiated emission was suppressed by 22 dB owing to the outstanding noise isolation efficiency of the high dielectric constant thin film EBG PDN.
Keywords :
electromagnetic interference; high-k dielectric thin films; interference suppression; permittivity; photonic band gap; power distribution; printed circuit testing; 300 MHz to 3.6 GHz; EBG; broadband simultaneous switched noise suppression; broadband spectrum; electromagnetic band-gap; high-dielectric constant thin film; high-speed digital PCB; noise isolation efficiency; power distribution network; power plane noises; radiated emissions suppression; Automatic testing; Dielectric measurements; Dielectric thin films; High-K gate dielectrics; Impedance measurement; Noise measurement; Noise reduction; Power measurement; Power systems; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2005. EMC 2005. 2005 International Symposium on
Print_ISBN :
0-7803-9380-5
Type :
conf
DOI :
10.1109/ISEMC.2005.1513665
Filename :
1513665
Link To Document :
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