DocumentCode
2098128
Title
Distinguishing between Perfect and Faulty Insulators by Bispectrum and Classifier
Author
Wen, Kang-Zhen ; Wen, Yuan-Fang ; Lu, Jian-Shuang
Author_Institution
Coll. of Electr. & Electron. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
fYear
2010
fDate
28-31 March 2010
Firstpage
1
Lastpage
4
Abstract
According to analyzing the datum of the leakage currents from both perfect and faulty insulators that are at the state of various dirtiness, humidity, and temperature, and are applied non-sinusoidal voltages at different virtual values, three results are obtained. First, the bispectrum of the leakage current from contaminated insulator is mostly related to insulator; not to dirtiness. Bispectrum is the eigenvalue sensitive to distinguishing between perfect and faulty insulators. Secondly, a three-dimensional vector, which consists of the v of bispectrum, Shannon entropy, and wave crest factor, can divide all the insulators into two not only non-overlapping but far apart regions. One is the region of perfect insulators. The other is the region of faulty insulators. Thirdly, using above a three-dimensional vector as input vector, any of three classifiers, Euclide distance judgment, grey relational analysis of B-mode, and BP artificial neural network, can exactly distinguish between perfect and faulty insulators at various dirtiness, humidity, temperature and the virtual values of the voltage involving harmonics.
Keywords
backpropagation; eigenvalues and eigenfunctions; insulators; leakage currents; neural nets; power engineering computing; BP artificial neural network; Euclide distance; Shannon entropy; bispectrum; classifier; faulty insulators; leakage currents; three-dimensional vector; Artificial neural networks; Dielectrics and electrical insulation; Educational institutions; Eigenvalues and eigenfunctions; Humidity; Leakage current; Power system harmonics; Temperature; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
Conference_Location
Chengdu
Print_ISBN
978-1-4244-4812-8
Electronic_ISBN
978-1-4244-4813-5
Type
conf
DOI
10.1109/APPEEC.2010.5448610
Filename
5448610
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