Title :
Distinguishing between Perfect and Faulty Insulators by Bispectrum and Classifier
Author :
Wen, Kang-Zhen ; Wen, Yuan-Fang ; Lu, Jian-Shuang
Author_Institution :
Coll. of Electr. & Electron. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
According to analyzing the datum of the leakage currents from both perfect and faulty insulators that are at the state of various dirtiness, humidity, and temperature, and are applied non-sinusoidal voltages at different virtual values, three results are obtained. First, the bispectrum of the leakage current from contaminated insulator is mostly related to insulator; not to dirtiness. Bispectrum is the eigenvalue sensitive to distinguishing between perfect and faulty insulators. Secondly, a three-dimensional vector, which consists of the v of bispectrum, Shannon entropy, and wave crest factor, can divide all the insulators into two not only non-overlapping but far apart regions. One is the region of perfect insulators. The other is the region of faulty insulators. Thirdly, using above a three-dimensional vector as input vector, any of three classifiers, Euclide distance judgment, grey relational analysis of B-mode, and BP artificial neural network, can exactly distinguish between perfect and faulty insulators at various dirtiness, humidity, temperature and the virtual values of the voltage involving harmonics.
Keywords :
backpropagation; eigenvalues and eigenfunctions; insulators; leakage currents; neural nets; power engineering computing; BP artificial neural network; Euclide distance; Shannon entropy; bispectrum; classifier; faulty insulators; leakage currents; three-dimensional vector; Artificial neural networks; Dielectrics and electrical insulation; Educational institutions; Eigenvalues and eigenfunctions; Humidity; Leakage current; Power system harmonics; Temperature; Testing; Voltage;
Conference_Titel :
Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-4812-8
Electronic_ISBN :
978-1-4244-4813-5
DOI :
10.1109/APPEEC.2010.5448610