Application of the dual-loaded Modulated Scatterer Technique to multilayered material evaluation

Author

Donnell, Kristen M. ; Zoughi, Reza

Author_Institution

Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA

fYear

2011

fDate

10-12 May 2011

Firstpage

1

Lastpage

4

Abstract

Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.

Keywords

condition monitoring; electromagnetic wave scattering; microwave materials; microwave measurement; multilayers; nondestructive testing; radiowave propagation; dual loaded modulated scatterer technique; dual loaded scatterer; embedded modulated scatterer technique; infrastructure health monitoring; multilayer structure assessment; multilayered material evaluation; nondestructive testing techniques; Antenna measurements; Nonhomogeneous media; PIN photodiodes; Probes; Reflection; Transceivers; Embedded Sensor; Loaded Scatterer; Materials Characterization; Microwave Nondestructive Testing; Modulated Scatterer Technique;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE

Conference_Location

Binjiang

ISSN

1091-5281

Print_ISBN

978-1-4244-7933-7

Type

conf

DOI

10.1109/IMTC.2011.5944194

Filename

5944194