Title :
Application of the dual-loaded Modulated Scatterer Technique to multilayered material evaluation
Author :
Donnell, Kristen M. ; Zoughi, Reza
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
Health monitoring of infrastructure is an important concern. There are a number of nondestructive testing techniques that have been developed for this purpose. Embedded Modulated Scatterer Technique (MST) is one such method. This paper presents embedded MST, utilizing a dual-loaded scatterer, as applied to multilayer structure assessment. Simulation and measurement results are provided.
Keywords :
condition monitoring; electromagnetic wave scattering; microwave materials; microwave measurement; multilayers; nondestructive testing; radiowave propagation; dual loaded modulated scatterer technique; dual loaded scatterer; embedded modulated scatterer technique; infrastructure health monitoring; multilayer structure assessment; multilayered material evaluation; nondestructive testing techniques; Antenna measurements; Nonhomogeneous media; PIN photodiodes; Probes; Reflection; Transceivers; Embedded Sensor; Loaded Scatterer; Materials Characterization; Microwave Nondestructive Testing; Modulated Scatterer Technique;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location :
Binjiang
Print_ISBN :
978-1-4244-7933-7
DOI :
10.1109/IMTC.2011.5944194
