Title :
Integrated design of a compact Ka-band one-port vector reflectometer
Author :
Fallahpour, M. ; Baumgartner, M. ; Ghasr, M.T. ; Zoughi, R. ; Pommerenke, D.
Author_Institution :
Electr. & Comput. Eng. Dept., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
In this paper, an integrated design of a compact one-port vector millimeter wave reflectometer or network analyzer (VNA), operating in the Ka-band (26.5-40 GHz) frequency range is presented. The design follows that of a recently-developed VNA, but with the goal of incorporating its critical components into one integrated system so as to make it smaller, improve its measurement accuracy and source stability, while incorporating on-board control and data collection approach. The most critical high-frequency component of this design is an electronically-controlled phase shifter, designed using sub-resonant PIN diode-loaded slots incorporated in the broad wall of a rectangular waveguide. Using a non-uniform spacing scheme used in the placement of the slots is shown to significantly reduce unwanted resonances. In addition, slot-coupled rectangular waveguide-tee configuration is used for the standing-wave probe section of this reflectometer which is incorporated into the phase shifter on the same high-frequency printed circuit board (PCB). Finally, this new design provides the possibility of using a more accurate three-port S-parameters characterization instead of a two-port characterization. The design foundation and some results of extensive simulations are shown in this paper.
Keywords :
S-parameters; microwave measurement; microwave phase shifters; millimetre wave measurement; millimetre wave phase shifters; network analysers; printed circuits; rectangular waveguides; reflectometers; VNA; compact Ka-band one-port vector reflectometer design; data collection; electronically-controlled phase shifter design; frequency 26.5 GHz to 40 GHz; high-frequency PCB; high-frequency same printed circuit board; measurement accuracy; millimeter wave reflectometer; nonuniform spacing scheme; on-board control; one-port vector network analyzer; slot-coupled rectangular waveguide-tee configuration; source stability; standing-wave probe section; subresonant PIN diode-loaded slot; three-port S-parameters characterization; Detectors; Microwave imaging; Phase measurement; Phase shifters; Probes; Rectangular waveguides; Resonant frequency; phase shifter; standing-wave probe; sub-resonant slots; vector netwrok analyzer;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location :
Binjiang
Print_ISBN :
978-1-4244-7933-7
DOI :
10.1109/IMTC.2011.5944200