• DocumentCode
    2098807
  • Title

    A study of the thermal characteristics of a conductive adhesive chip attach process

  • Author

    Sathe, S. ; Sammakia, B. ; Kodnani, R. ; Gaynes, M.

  • Author_Institution
    Microelectron. Div., IBM Corp., Endicott, NY, USA
  • fYear
    1997
  • fDate
    18-21 May 1997
  • Firstpage
    1182
  • Lastpage
    1187
  • Abstract
    Electrically conductive adhesives (ECAs) have been proposed as an alternative to solder in the surface mount (SMT) and flip chip attach (FCA) applications. This paper describes the development of a transient heat transfer model of a chip bonding process using the ECA bumps. The chip is heated using a top thermode directly contacting the chip and the card is heated from the back side (Z=0) using a heater. A detailed three-dimensional heat transfer model to account for the conduction, heat storage and convection and radiation from the card is developed using the finite volume technique. The spatial and temporal temperature distributions are studied through initial ramp-up, dwell and cool-down processes. It is seen that the bump temperatures are dominated and controlled by the heating process near the chip as opposed to heating the back side of the card. The numerical model is verified via actual measurements and the agreement is within 15 percent
  • Keywords
    adhesion; conducting materials; convection; cooling; finite element analysis; flip-chip devices; heat conduction; heat radiation; integrated circuit packaging; surface mount technology; transient analysis; SMT; bump temperatures; chip bonding process; conduction; conductive adhesive chip attach; convection; cool-down processes; dwell process; electrically conductive adhesives; finite volume technique; flip chip attach; heat radiation; heat storage; initial ramp-up; temperature distributions; thermal characteristics; three-dimensional heat transfer model; transient heat transfer model; Bonding processes; Conductive adhesives; Flip chip; Heat transfer; Heating; Numerical models; Surface-mount technology; Temperature control; Temperature distribution; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1997. Proceedings., 47th
  • Conference_Location
    San Jose, CA
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-3857-X
  • Type

    conf

  • DOI
    10.1109/ECTC.1997.606325
  • Filename
    606325