Title :
A subjective assessment of a P300 BCI system for lower-limb rehabilitation purposes
Author :
Duvinage, M. ; Castermans, T. ; Petieau, M. ; Seetharaman, K. ; Hoellinger, Thomas ; Cheron, Guy ; Dutoit, Thierry
Author_Institution :
TCTS Lab., Univ. of Mons, Mons, Belgium
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
Recent research has shown that a P300 system can be used while walking without requiring any specific gait-related artifact removal techniques. Also, standard EEG-based Brain-Computer Interfaces (BCI) have not been really assessed for lower limb rehabilitation/prosthesis. Therefore, this paper gives a first baseline estimation (for future BCI comparisons) of the subjective and objective performances of a four-state P300 BCI plus a non-control state for lower-limb rehabilitation purposes. To assess usability and workload, the System Usability Scale and the NASA Task Load Index questionnaires were administered to five healthy subjects after performing a real-time treadmill speed control. Results show that the P300 BCI approach could suit fitness and rehabilitation applications, whereas prosthesis control, which suffers from a low reactivity, appears too sensitive for risky and crowded areas.
Keywords :
brain-computer interfaces; electroencephalography; gait analysis; medical signal processing; patient rehabilitation; prosthetics; NASA task load index questionnaires; P300 BCI system subjective assessment; baseline estimation; fitness application; lower-limb rehabilitation; prosthesis control; specific gait-related artifact removal method; standard EEG-based brain-computer interfaces; system usability scale; usability assessment; walking; workload assessment; Electroencephalography; Legged locomotion; Pipelines; Prosthetics; Reliability; Standards; Usability; Adult; Brain; Event-Related Potentials, P300; Female; Humans; Lower Extremity; Male; Questionnaires; Rehabilitation; User-Computer Interface; Young Adult;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346806