Title :
Tools and methodology for RF IC design
Author :
Dunlop, AI ; Demir, Alper ; Feldmann, Peter ; Kapur, Sharad ; Long, David ; Melville, Robert ; Roychowdhury, Jaijeet
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
Abstract :
We describe powerful new techniques for the analysis of RF circuits. Next-generation CAD tools based on such techniques should enable RF designers to obtain a more accurate picture of how their circuits will operate. These new simulation capabilities will be essential in order to reduce the number of design iterations needed to produce complex RF ICs.
Keywords :
circuit CAD; circuit analysis computing; integrated circuit design; CAD tools; RF ICs; RF circuits; simulation capabilities; 1f noise; Circuit noise; Crosstalk; Design automation; Design methodology; Magnetic noise; Permission; Radio frequency; Radiofrequency integrated circuits; Silicon;
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5
