Assessment of high power diode laser arrays by Fourier-transform photocurrent measurements

Author

Tomm, J.W. ; Batwolff, A. ; Gerhardt, A. ; Donecker, J.

Author_Institution

Max-Born-Inst. for Nichtlineare Optik & Kurzzeitspektro skopic, Berlin, Germany

fYear

1997

fDate

18-21 May 1997

Firstpage

1194

Lastpage

1198

Abstract

We present new results on aging properties of high-power laser diode arrays (LDA) obtained by Fourier-transform (FT) spectroscopy. The FT spectrometer was used as excitation source for performing photocurrent measurements on two sets of aged 10 W high power LDA. The photocurrent (PC) Spectra were found to reveal aging induced changes of the LDA. Both the evolution of defect contributions located in the optically active layer as well as modifications of the interband contribution of the spectrum can be used as a measure of the aging status of an individual LDA. Thus we introduce a new, fast and nondestructive method for the assessment of high power LDA. Furthermore, additional insight into the microscopic nature of the processes accompanied by aging is provided

Keywords

Fourier transform spectroscopy; ageing; laser reliability; laser variables measurement; nondestructive testing; photoconductivity; semiconductor laser arrays; 10 W; FT spectroscopy; Fourier-transform photocurrent measurements; aging properties; defect contributions; excitation source; high power diode laser arrays; interband contribution; nondestructive method; optically active layer; Aging; Diode lasers; Laser excitation; Linear discriminant analysis; Optical arrays; Performance evaluation; Photoconductivity; Power measurement; Semiconductor laser arrays; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Electronic Components and Technology Conference, 1997. Proceedings., 47th

Conference_Location

San Jose, CA

ISSN

0569-5503

Print_ISBN

0-7803-3857-X

Type

conf

DOI

10.1109/ECTC.1997.606327

Filename

606327