DocumentCode :
2099501
Title :
Single pulse analysis of intracranial pressure for a hydrocephalus implant
Author :
Elixmann, I.M. ; Hansinger, J. ; Goffin, C. ; Antes, S. ; Radermacher, Klaus ; Leonhardt, Steffen
Author_Institution :
Helmholtz Inst. for Biomed. Eng., RWTH Aachen Univ., Aachen, Germany
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
3939
Lastpage :
3942
Abstract :
The intracranial pressure (ICP) waveform contains important diagnostic information. Changes in ICP are associated with changes of the pulse waveform. This change has explicitly been observed in 13 infusion tests by analyzing 100 Hz ICP data. An algorithm is proposed which automatically extracts the pulse waves and categorizes them into predefined patterns. A developed algorithm determined 88%±8% (mean ±SD) of all classified pulse waves correctly on predefined patterns. This algorithm has low computational cost and is independent of a pressure drift in the sensor by using only the relationship between special waveform characteristics. Hence, it could be implemented on a microcontroller of a future electromechanic hydrocephalus shunt system to control the drainage of cerebrospinal fluid (CSF).
Keywords :
brain; medical signal processing; microcontrollers; pattern classification; pressure measurement; prosthetics; ICP data; cerebrospinal fluid drainage control; electromechanic hydrocephalus shunt system; frequency 100 Hz; hydrocephalus implant; infusion tests; intracranial pressure waveform single pulse analysis; microcontroller; pressure drift; pulse wave extraction; Algorithm design and analysis; Classification algorithms; Fluids; Heuristic algorithms; Implants; Iterative closest point algorithm; Microcontrollers; Algorithms; Arterial Pressure; Electrodes, Implanted; Humans; Hydrocephalus; Intracranial Pressure; Pattern Recognition, Automated; Signal Processing, Computer-Assisted; Wavelet Analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346828
Filename :
6346828
Link To Document :
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