• DocumentCode
    2099877
  • Title

    Voltage Flicker Detection Based on Chirp-z Transform

  • Author

    Kang Wei ; Guo Jing ; Li Heming ; Yan Xiangwu

  • Author_Institution
    Coll. of Inf. & Control Eng., China Univ. of Pet., Dongying, China
  • fYear
    2010
  • fDate
    28-31 March 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Studying of the IEC flicker meter shows that the instantaneous flicker sensation level S can be calculated directly if the spectrums of fluctuating component of voltage are known. In this paper a novel flicker measurement method is proposed. First, the square demodulation is used to obtain the fluctuating component of voltage, and then the chirp-z transform (CZT) is used to get the amplitude and the frequency of wave component, and final the instantaneous flicker sensation level S. To process the wave component by CZT can acgwire precise spectrums without prolonging the sampling time and decrease the error produced by spectrum leakage. The IEC flicker meter and new method is compared in simulation and test. The result verified the correctness and efficiency of the theoretical prediction.
  • Keywords
    Z transforms; power supply quality; power system measurement; IEC flicker meter; chirp-z transform; flicker measurement method; spectrum leakage; voltage flicker detection; Brain modeling; Chirp; Demodulation; Educational institutions; Frequency; Humans; IEC standards; Leak detection; Sampling methods; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4812-8
  • Electronic_ISBN
    978-1-4244-4813-5
  • Type

    conf

  • DOI
    10.1109/APPEEC.2010.5448684
  • Filename
    5448684