Title :
Automatic detection of internal defects in solar cells
Author :
Lin, Wu-Ja ; Lei, Yu-Hsien ; Huang, Chih-Hsien
Author_Institution :
Dept. of Comput. Sci. & Inf. Eng., Nat. Formosa Univ., Huwei, Taiwan
Abstract :
In this manuscript, a system which automatically detects internal defects in solar cell is proposed. The proposed system applies a bias flow to the solar cell, captures emissions of solar cell, and processes captured image to recognize the internal defects of the solar cell. The experimental results show that the proposed system can successfully detect the internal defect of solar cell which can not be found by visual inspection.
Keywords :
inspection; solar cells; automatic detection; internal defects; solar cells; Cameras; Charge coupled devices; Image processing; Inspection; Photovoltaic cells; Pixel; Silicon; automatic inspection; image processing; internal crack; solar cell;
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location :
Binjiang
Print_ISBN :
978-1-4244-7933-7
DOI :
10.1109/IMTC.2011.5944258