DocumentCode :
2100434
Title :
Fast state verification
Author :
Sun, Dechang ; Vinnakota, Bapiraju ; Jiang, Wanli
Author_Institution :
Dept. of Electr. & Comput. Eng., Minnesota Univ., Minneapolis, MN, USA
fYear :
1998
fDate :
19-19 June 1998
Firstpage :
619
Lastpage :
624
Abstract :
Unique input/output (UIO) sequences are used for state verification and functional test in finite state machines. A UIO sequence for a state s distinguishes it from other states in the FSM. Current algorithms to compute UIO sequences are limited in their applicability to FSMs with binary input symbols such as those found in control applications. Execution times of traditional approaches are exponential in the number of FSM inputs. We develop a new heuristic algorithm to generate UIO sequences for FSMs with binary inputs. Execution time is reduced significantly by reducing the size of the search space. When a UIO sequence cannot be generated, our algorithm generates a small number of functional faults for state verification.
Keywords :
finite state machines; formal verification; heuristic programming; binary input symbols; binary inputs; fast state verification; finite state machines; functional faults; functional test; heuristic algorithm; unique input/output sequences; Automata; Computer networks; Permission; Protocols; Sun; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5
Type :
conf
Filename :
724546
Link To Document :
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