DocumentCode :
2100536
Title :
Silicon-on-insulator based miniature integrated spectrometer using echelle diffraction grating
Author :
Li Qin ; Lei Wang ; Ming-Yu Li ; Jian-Jun He
Author_Institution :
State Key Lab. of Modern Opt. Instrum., Zhejiang Univ., Hangzhou, China
fYear :
2011
fDate :
13-16 Nov. 2011
Firstpage :
1
Lastpage :
3
Abstract :
The design of an on-chip spectrometer based on a silicon-on-insulator planar echelle diffraction grating (EDG) is presented. It has 129 channels, 0.25 nm channel spacing, and 0.1 nm FWHM bandwidth. The spectral range is 1534 nm~1566 nm. The size of the chip is about 0.7 cm×1 cm.
Keywords :
diffraction gratings; integrated optoelectronics; optical design techniques; silicon-on-insulator; spectrometers; FWHM bandwidth; Si; on-chip spectrometer; silicon-on-insulator based miniature integrated spectrometer; silicon-on-insulator planar echelle diffraction grating; size 0.7 cm; size 1 cm; echelle diffraction grating (EDG); silicon-on-insulator (SOI); spectrometer-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications and Photonics Conference and Exhibition, 2011. ACP. Asia
Conference_Location :
Shanghai
ISSN :
2162-108X
Print_ISBN :
978-0-8194-8961-6
Type :
conf
Filename :
6511074
Link To Document :
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