Title :
Functional verification of large ASICs
Author :
Evans, Adrian ; Silburt, Allan ; Vrckovnik, Gary ; Brown, Thane ; Dufresne, Mario ; Hall, Geoffrey ; Ho, Tung ; Liu, Ying
Author_Institution :
Nortel, Ottawa, Ont., Canada
Abstract :
This paper describes the functional verification effort during a specific hardware development program that included three of the largest ASPCs designed at Nortel. These devices marked a transition point in methodology as verification took front and centre on the critical path of the ASIC schedule. Both the simulation and emulation strategies are presented. The simulation methodology introduced new techniques such as ASIC sub-system level behavioural modeling, large multi-chip simulations, and random pattern simulations. The emulation strategy was based on a plan that consisted of integrating parts of the real software on the emulated system. This paper describes how these technologies were deployed, analyzes the bugs that were found and highlights the bottlenecks in functional verification as systems become more complex.
Keywords :
application specific integrated circuits; formal verification; logic testing; ASIC; emulation; functional verification; hardware development program; simulation; Analytical models; Application specific integrated circuits; Circuit simulation; Computer bugs; Emulation; Hardware; Permission; Printed circuits; Protocols; System testing;
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5