Differential Thermal Analysis of Nanostructured Si0.80Ge0.20 Thermoelectric Material

Author

Tayebi, Lobat ; Zamanipour, Zahra ; Mozafari, Masoud ; Norouzzadeh, Payam ; Ede, Kenneth F. ; Krasinski, Jerzy S. ; Vashaee, Daryoosh

Author_Institution

Helmerich Adv. Technol. Res. Center, Tulsa, OK, USA

fYear

2012

fDate

19-20 April 2012

Firstpage

1

Lastpage

4

Abstract

Thermoelectric effect becomes one of the important elements in sustainable energy due to its capability in green conversion of waste heat into electrical energy. Among various thermoelectric materials, nanostructured-Si_0.80Ge_0.20 is being widely investigated owing to its efficient thermoelectric effect at high temperature. In this manuscript, we studied differential thermal analysis (DTA) of Si_0.80Ge_0.20 thermoelectric alloy in detail. Our DTA study revealed the fact that in almost all alloys of nanostrcutured Si_0.80Ge_0.20 prepared with mechanical ball milling, the sample is not in Si0.80Ge_0.20 phase but is in composite mixed phases of Si_0.88Ge_0.12 and small amount of Si_0.55Ge_0.45. This phase impurity can hardly be seen in X-ray diffraction patterns and is often neglected.

Keywords

Ge-Si alloys; X-ray diffraction; ball milling; differential thermal analysis; elemental semiconductors; nanofabrication; nanostructured materials; semiconductor growth; thermoelectricity; DTA; Si_0.80Ge_0.20; X-ray diffraction; differential thermal analysis; mechanical ball milling; nanostructured silicon-germanium alloys; thermoelectric effect; thermoelectric material; Metals; Silicon; Silicon germanium; Thermal analysis; Thermal stability; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Green Technologies Conference, 2012 IEEE

Conference_Location

Tulsa, OK

ISSN

2166-546X

Print_ISBN

978-1-4673-0968-4

Electronic_ISBN

2166-546X

Type

conf

DOI

10.1109/GREEN.2012.6200977

Filename

6200977