DocumentCode :
2100841
Title :
Transient voltage dip analysis using the transient energy function method
Author :
Fouad, A.A. ; Sreedhara, Ramadevi
Author_Institution :
Iowa State Univ., Ames, IA, USA
fYear :
1990
fDate :
15-16 Oct 1990
Firstpage :
264
Lastpage :
273
Abstract :
It is shown that the transient energy function (TEF) method provides a fast approximate approach to voltage dip computations. The TEF method is used to predict the stability of a power system after a disturbance has occurred. The results of application of the technique to test power systems confirmed that the voltage dips predicted by the TEF method compare well with the values from time domain simulation techniques. An interesting observation is the discrepancy between the two time simulation programs. One of the programs used smaller values of network solution tolerance and solution time step as compared to the other time simulation program. The TEF results showed a consistent pattern of voltage behavior (i.e., the predicted values were lower than the time simulation values). Where there was a discrepancy between the two results, the error was on the conservative or safe side
Keywords :
power systems; transients; disturbance; power system; stability; time domain simulation; transient energy function method; transient voltage dip analysis; voltage dip computations; Electronics packaging; Industrial power systems; Nuclear power generation; Potential energy; Power generation; Power system reliability; Power system stability; Power system transients; Transient analysis; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Symposium, 1990., Proceedings of the Twenty-Second Annual North American
Conference_Location :
Auburn, AL
Print_ISBN :
0-8186-2115-X
Type :
conf
DOI :
10.1109/NAPS.1990.151379
Filename :
151379
Link To Document :
بازگشت