DocumentCode :
2100876
Title :
Digital to analog converters test based on time to voltage conversion
Author :
Baccigalupi, A. ; Liccardo, A. ; Grimaldi, D. ; Carnì, D.L.
Author_Institution :
Dept. of Comput. Sci., Univ. Federico II, Naples, Italy
fYear :
2011
fDate :
10-12 May 2011
Firstpage :
1
Lastpage :
6
Abstract :
The paper deals with a low cost measurement station for DAC dynamic characterization. The characterization method is based on the estimate of the DAC output voltage through the measurement of time intervals. These are performed by the DSP, which evaluates the time between two edges of the input signal. A proper system has been implemented with the aim of conditioning the DAC output signal in order to obtain a resulting square shaped signal with width proportional to the DAC output voltage. The advantages of the method are: (i) DAC voltages estimated by means of time interval measurements, this permits to obtain higher resolution respect to amplitude measurements; (ii) measurement set up characterized by limited size and costs, this supports the realize of BIST (built-in self-test) system.
Keywords :
built-in self test; digital-analogue conversion; time measurement; amplitude measurements; built-in self-test system; digital to analog converters test; low cost measurement station; time interval measurements; time to voltage conversion; Accuracy; Digital signal processing; Frequency measurement; Signal resolution; Time measurement; Uncertainty; Voltage measurement; DAC dynamic characterization; Digital Signal Processor; Width and period measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location :
Binjiang
ISSN :
1091-5281
Print_ISBN :
978-1-4244-7933-7
Type :
conf
DOI :
10.1109/IMTC.2011.5944277
Filename :
5944277
Link To Document :
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