Digital to analog converters test based on time to voltage conversion

Author

Baccigalupi, A. ; Liccardo, A. ; Grimaldi, D. ; Carnì, D.L.

Author_Institution

Dept. of Comput. Sci., Univ. Federico II, Naples, Italy

fYear

2011

fDate

10-12 May 2011

Firstpage

1

Lastpage

6

Abstract

The paper deals with a low cost measurement station for DAC dynamic characterization. The characterization method is based on the estimate of the DAC output voltage through the measurement of time intervals. These are performed by the DSP, which evaluates the time between two edges of the input signal. A proper system has been implemented with the aim of conditioning the DAC output signal in order to obtain a resulting square shaped signal with width proportional to the DAC output voltage. The advantages of the method are: (i) DAC voltages estimated by means of time interval measurements, this permits to obtain higher resolution respect to amplitude measurements; (ii) measurement set up characterized by limited size and costs, this supports the realize of BIST (built-in self-test) system.

Keywords

built-in self test; digital-analogue conversion; time measurement; amplitude measurements; built-in self-test system; digital to analog converters test; low cost measurement station; time interval measurements; time to voltage conversion; Accuracy; Digital signal processing; Frequency measurement; Signal resolution; Time measurement; Uncertainty; Voltage measurement; DAC dynamic characterization; Digital Signal Processor; Width and period measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE

Conference_Location

Binjiang

ISSN

1091-5281

Print_ISBN

978-1-4244-7933-7

Type

conf

DOI

10.1109/IMTC.2011.5944277

Filename

5944277