DocumentCode :
2101278
Title :
Comparative study between Sample Entropy and Detrended Fluctuation Analysis performance on EEG records under data loss
Author :
Cirugeda-Roldan, E.M. ; Molina-Pico, A. ; Cuesta-Frau, D. ; Oltra-Crespo, S. ; Miro-Martinez, P.
Author_Institution :
Comput. Sci. Dept. (DISCA), Polytech. Univ. of Valencia, Valencia, Spain
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
4233
Lastpage :
4236
Abstract :
This study compares two signal entropy measures, Sample Entropy (SampEn) and Detrended Fluctuation Analysis (DFA) over real EEG signals after a randomized sample removal. Both measures have demonstrated their ability to discern between, among others: control and pathologic EEG signals, seizure free or not, control and opened eyes EEG, and side of brain signals. Results show that SampEn behaves better when analyzing control signals, while DFA provides better segmentation results between epileptic signals, in the context of sample loss, particularly when discerning between seizure and seizure free signal intervals.
Keywords :
electroencephalography; entropy; medical signal processing; neurophysiology; random processes; DFA; EEG records; SampEn; brain signals; control EEG signals; detrended fluctuation analysis performance; epileptic signal segmentation; opened eyes EEG; pathologic EEG signals; randomized sample removal; sample entropy; sample loss; seizure free signal intervals; signal entropy measures; Correlation; Doped fiber amplifiers; Electroencephalography; Entropy; Fluctuations; Loss measurement; Algorithms; Artifacts; Brain; Data Interpretation, Statistical; Diagnosis, Computer-Assisted; Electroencephalography; Entropy; Reproducibility of Results; Sample Size; Sensitivity and Specificity; Signal Processing, Computer-Assisted;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346901
Filename :
6346901
Link To Document :
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