DocumentCode :
21014
Title :
Hydrazine-Based Fermi-Level Depinning Process on Metal/Germanium Schottky Junction
Author :
Hyun-Wook Jung ; Woo-Shik Jung ; Jin-Hong Park
Author_Institution :
Sch. of Electron. & Electr. Eng., Sungkyunkwan Univ., Suwon, South Korea
Volume :
34
Issue :
5
fYear :
2013
fDate :
May-13
Firstpage :
599
Lastpage :
601
Abstract :
In this letter, we propose a hydrazine (N2H4)-based nitridation process, which reduces the native oxide (GeOx) component and finally transforms it into GeOxNy on intrinsic Ge, to relieve the EF pinning problem. The decomposition of GeOx and formation of GeOxNy by N2H4 are systematically investigated through cross-sectional transmission electron microscopy, X-ray photoelectron spectroscopy, and atomic force microscopy analyses. After performing the N2H4-based nitridation process for 12 h, high ΦH (~0.59 eV) and therefore high ON/OFF current ratio (~104) are achieved for Ti/Ge Schottky junction diode.
Keywords :
Fermi level; Schottky diodes; X-ray photoelectron spectra; atomic force microscopy; decomposition; germanium; germanium compounds; nitridation; nitrogen compounds; titanium; transmission electron microscopy; EF pinning problem; GeOxNy; N2H4; Ti-Ge; Ti-Ge Schottky junction diode; X-ray photoelectron spectroscopy; atomic force microscopy; cross-sectional transmission electron microscopy; decomposition; hydrazine-based Fermi-level depinning process; intrinsic Ge; metal-germanium Schottky junction; native oxide component; nitridation process; on-off current ratio; time 12 h; Fermi-level depinning; Germanium; Schottky diode; hydrazine; passivation;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2253759
Filename :
6502197
Link To Document :
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