Title :
Weak Signals Detection and Single Photon Counting with Ultraviolet SiC-based Avalanche Photodiodes
Author :
Vertiatchikh, Alexei ; Sandvik, Peter ; Soloviev, Stanislav ; Cha, Ho-Young ; Fronheiser, Jody
Author_Institution :
GE Global Res., Niskayuna
Abstract :
We report on the responsivity measurement of these devices in the linear regime with quantum efficiency of up to 45%. Responsivity attenuation is significant at wavelengths longer than 400nm and thin film dielectric stack filters may be used to tailor the wavelength response of the SiC APDs for various applications, including those requiring their use in the UV-A, UV-B and UV-C ranges with very good blocking in the visible or solar spectrum.
Keywords :
avalanche photodiodes; photon counting; silicon compounds; ultraviolet detectors; wide band gap semiconductors; SiC; linear regime; responsivity attenuation; responsivity measurement; single photon counting; thin film dielectric stack filters; ultraviolet avalanche photodiodes; wavelength response; weak signals detection; Absorption; Avalanche photodiodes; Delay effects; Dielectric measurements; Dielectric thin films; Phase detection; Photonic band gap; Signal detection; Silicon carbide; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-0925-9
Electronic_ISBN :
1092-8081
DOI :
10.1109/LEOS.2007.4382444
