Weak Signals Detection and Single Photon Counting with Ultraviolet SiC-based Avalanche Photodiodes

Author

Vertiatchikh, Alexei ; Sandvik, Peter ; Soloviev, Stanislav ; Cha, Ho-Young ; Fronheiser, Jody

Author_Institution

GE Global Res., Niskayuna

fYear

2007

fDate

21-25 Oct. 2007

Firstpage

393

Lastpage

394

Abstract

We report on the responsivity measurement of these devices in the linear regime with quantum efficiency of up to 45%. Responsivity attenuation is significant at wavelengths longer than 400nm and thin film dielectric stack filters may be used to tailor the wavelength response of the SiC APDs for various applications, including those requiring their use in the UV-A, UV-B and UV-C ranges with very good blocking in the visible or solar spectrum.

Keywords

avalanche photodiodes; photon counting; silicon compounds; ultraviolet detectors; wide band gap semiconductors; SiC; linear regime; responsivity attenuation; responsivity measurement; single photon counting; thin film dielectric stack filters; ultraviolet avalanche photodiodes; wavelength response; weak signals detection; Absorption; Avalanche photodiodes; Delay effects; Dielectric measurements; Dielectric thin films; Phase detection; Photonic band gap; Signal detection; Silicon carbide; Wavelength measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE

Conference_Location

Lake Buena Vista, FL

ISSN

1092-8081

Print_ISBN

978-1-4244-0925-9

Electronic_ISBN

1092-8081

Type

conf

DOI

10.1109/LEOS.2007.4382444

Filename

4382444