Fault diagnosis using dynamic finite-state automaton models

Author

Xi, Yun-Xia ; Lim, Khiang-Wee ; Ho, Weng-Khuen ; Preisig, Heinz A.

Author_Institution

Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore

Volume

1

fYear

2001

fDate

2001

Firstpage

484

Abstract

The paper continues the development of an algorithm for fault diagnosis using a Finite-state Automaton (FSA) model. The plant is represented by a set of Finite-state Automaton Tables (FATS) that can be dynamically generated for normal input and for fault input conditions. A fault detection and isolation algorithm compares actual plant events with that predicted by the FATS. The paper defines fault diagnosability of the FATS, identifies some conditions for nondiagnosability, discusses guidelines for choosing the set of boundaries that helps define the FATS and provides a method for dynamically computing the FATS. We illustrate the application of the approach on a batch system

Keywords

computerised instrumentation; fault diagnosis; finite state machines; modelling; FATS; FSA model; dynamic computing; dynamic finite-state automaton models; fault detection and isolation algorithm; fault diagnosability; fault diagnosis; fault input conditions; nondiagnosability; normal input; plant events; Automata; Discrete event systems; Fats; Fault detection; Fault diagnosis; Guidelines; Industrial plants; Physics; Process control; Robust control;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics Society, 2001. IECON '01. The 27th Annual Conference of the IEEE

Conference_Location

Denver, CO

Print_ISBN

0-7803-7108-9

Type

conf

DOI

10.1109/IECON.2001.976530

Filename

976530