DocumentCode :
2101601
Title :
Impact of SAW device passivation on RF performance
Author :
Marks, B.W. ; Sheddrick, D.W. ; Shen Jen
Author_Institution :
RF Monolithics, Dallas, TX, USA
Volume :
1
fYear :
1999
fDate :
17-20 Oct. 1999
Firstpage :
1
Abstract :
Passivation layers consisting of sputtered Al2O3 have been deposited onto SAW devices for the purpose of reducing the incidence of shorts. A coupling-of-modes model was used with one-port resonators, coupled resonator filters and test structures. The passivation layer stiffens the surface, with a velocity increase proportional to (t/λ), where t is the passivation layer thickness. Attenuation is increased slightly, producing a 0.25 dB increase in the loss of a one-port resonator at 314 MHz. The effect on reflectivity is minimal, and of much lesser importance to the designer.
Keywords :
alumina; passivation; radiofrequency filters; sputtered coatings; surface acoustic wave resonator filters; surface acoustic wave resonators; 314 MHz; Al2O3; Al2O3 sputtered layer; RF characteristics; SAW device; coupled resonator filters; coupling-of-modes model; one-port resonator; passivation; test structure; Attenuation; Insertion loss; Passivation; Radio frequency; Reflectivity; Resonator filters; Surface acoustic wave devices; Surface acoustic waves; Testing; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location :
Caesars Tahoe, NV
ISSN :
1051-0117
Print_ISBN :
0-7803-5722-1
Type :
conf
DOI :
10.1109/ULTSYM.1999.849344
Filename :
849344
Link To Document :
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