Full-chip verification methods for DSM power distribution systems

Power distribution verification is rapidly becoming a necessary step in deep submicron (DSM) design of high performance integrated circuits. With the increased load and reduced tolerances of DSM circuits, more failures are being seen due to poorly designed power distribution systems. This paper describes an efficient approach for the verification of power distribution at the full-chip transistor level based on a combination of hierarchical static and dynamic techniques. Application of the methodology on practical design examples is provided. We also demonstrate the necessity of analysis at the full-chip transistor level to verify the complex interactions between different design blocks based on static and dynamic effects.