DocumentCode
2101754
Title
Multilayer measuring system and uncertainty analysis using ultrasonic sensors with wavelet transform
Author
Ingaroca, Nestor S Castro ; Villanueva, Juan M Mauricio ; Catunda, Sebastian Yuri Cavalcanti ; Santiago, Jose L Guzman ; Vargas, Carlos E Tisza
Author_Institution
Fac. of Electr. & Electron. Eng., Nat. Univ. of Eng., Lima, Peru
fYear
2011
fDate
10-12 May 2011
Firstpage
1
Lastpage
6
Abstract
A method for measuring multi-level fluid, based on ultrasonic echo detection by means of the wavelet transform (WT), is presented. The Wavelet Transform provides a tool for analyzing the time frequency evolution of transient signals. This highlights the excellent performance shown by the WT as a powerful tool for the analysis of echoes in a noisy environment. A mother wavelet is utilized to obtain the time evolution of the various spectral components of the ultrasonic signal, and the decomposition of the wavelet transform is used to represent the envelope of the ultrasonic pulse and to determine the time of arrival of ultrasonic signal called Time-of-Flight (ToF). To this purpose, tests on simulated signals transmitting and receiving from multi-level fluid are carried out. The influence of uncertainties associated with additive noise and attenuation of the ultrasonic signal on the multi-level measurement uncertainty is analyzed. An application example is shown in order to illustrate the proposed procedure.
Keywords
echo; level measurement; measurement uncertainty; ultrasonic transducers; wavelet transforms; multilayer measuring system; multilevel measurement uncertainty; time frequency evolution; time of flight; transient signal; ultrasonic echo detection; ultrasonic pulse; ultrasonic sensor; ultrasonic signal; wavelet transform; Acoustics; Measurement uncertainty; Multiresolution analysis; Ultrasonic variables measurement; Uncertainty; Wavelet transforms; Multi-level measurement; Wavelet Transform; ultrasonic transducer; uncertainty analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location
Binjiang
ISSN
1091-5281
Print_ISBN
978-1-4244-7933-7
Type
conf
DOI
10.1109/IMTC.2011.5944308
Filename
5944308
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