Title :
An interface circuit for high-accuracy signal processing of differential-capacitance transducers
Author :
Mochizuki, Kouji ; Masuda, Takashi ; Watanabe, Kenzo
Author_Institution :
Numazu Coll. of Technol., Numazu, Japan
Abstract :
For high-accuracy signal processing of differential-capacitance transducers, an interface circuit is developed. The architecture is based on the idea that the ratio of one of the transducer capacitances to its total capacitance represents the offset binary equivalent of the physical quantity under measurement. An op amp-based capacitance-to-voltage converter is commonly used for capacitance detection and an analog-to-digital converter is used for the ratiometric operation. A circuit analysis shows that the interface can detect the capacitance change as small as 0.01% of the total capacitance. Experimental results are also given to confirm the analysis
Keywords :
analogue-digital conversion; capacitance measurement; electric current measurement; electric sensing devices; equivalent circuits; operational amplifiers; signal processing equipment; ADC; capacitance change; capacitance-to-voltage converter; current sensing; differential-capacitance transducers; equivalent circuits; high-accuracy signal processing; interface circuit; nonlinear errors; offset binary equivalent; op amp-based; parallel plate capacitor; parasitic capacitances; physical quantity under measurement; ratiometric operation; total capacitance; Analog-digital conversion; CMOS integrated circuits; Capacitance measurement; Capacitors; Circuit analysis; Educational institutions; Electrodes; Signal processing; Transducers; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507562