Title :
Ultrahigh-Bandwidth WDM Signal Integrity in Silicon-on-Insulator Nanowire Waveguides
Author :
Lee, Benjamin G. ; Chen, Xiaogang ; Biberman, Aleksandr ; Liu, Xiaoping ; Hsieh, I-Wei ; Chou, Cheng-Yun ; Dadap, Jerry ; Osgood, Richard M. ; Bergman, Keren ; Xia, Fengnian ; Green, William ; Sekaric, Lidija ; Vlasov, Yurii
Author_Institution :
Columbia Univ., New York
Abstract :
We measure signal degradation from interchannel crosstalk of ultrahigh-bandwidth signals in silicon-on-insulator waveguides, and single-channel power penalty over a range of injection powers. The results validate the suitability of silicon-based nanowire interconnects for broadband WDM networks.
Keywords :
nanowires; optical interconnections; optical waveguides; wavelength division multiplexing; broadband WDM networks; interchannel crosstalk; interconnects; silicon-on-insulator nanowire waveguides; single-channel power penalty; Bandwidth; Bit error rate; Crosstalk; High speed optical techniques; Optical fiber polarization; Optical waveguides; Semiconductor device measurement; Silicon on insulator technology; Wavelength division multiplexing; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-0925-9
Electronic_ISBN :
1092-8081
DOI :
10.1109/LEOS.2007.4382484
