Title :
Competence model for embedded micro-and nanosystems
Author :
Schäfer, André ; Brück, Rainer ; Kleinert, Bruno ; Schmidt, Harald ; Fey, Dietmar ; Büchner, Steffen ; Jaschke, Steffen ; Schubert, Sigrid
Author_Institution :
Inst. of Microsyst. Technol., Univ. of Siegen, Siegen, Germany
Abstract :
In this paper, we describe the results of an expert survey conducted within the project “Competence development with embedded micro- and nanosystems”. This survey was designed in order to refine our previously derived normative competence structure model for developers of embedded micro-and nanosystems towards an empirically refined competence structure model. Today the size of structural parts of nanosystems has scaled down to as few as a couple of molecules. This results in a lot of challenges regarding permanent and transient faults. Therefore bottom-up development techniques for nanostructured systems are now included into our competence model to prepare future developers to the specific challenges of designing at the nano scale. The evaluation of the content validity of the empirically refined competence structure model was accomplished by the presented expert rating.
Keywords :
embedded systems; software fault tolerance; bottom-up development technique; embedded microsystem; embedded nanosystem; expert rating; nanostructured system; normative competence structure model; permanent fault; refined competence structure model; transient fault; Computer science; Educational institutions; Embedded systems; Hardware; Mathematics; competence development; embedded systems; fault tolerance; nanoelectronics; parallel processing; redundancy; systems engineering education;
Conference_Titel :
Global Engineering Education Conference (EDUCON), 2012 IEEE
Conference_Location :
Marrakech
Print_ISBN :
978-1-4673-1457-2
Electronic_ISBN :
2165-9559
DOI :
10.1109/EDUCON.2012.6201062