• DocumentCode
    2102603
  • Title

    Extracting morphological high-level intuitive features (HLIF) for enhancing skin lesion classification

  • Author

    Amelard, Robert ; Wong, Alexander ; Clausi, David A.

  • Author_Institution
    Dept. of Syst. Design Eng., Univ. of Waterloo, Waterloo, ON, Canada
  • fYear
    2012
  • fDate
    Aug. 28 2012-Sept. 1 2012
  • Firstpage
    4458
  • Lastpage
    4461
  • Abstract
    Feature extraction of skin lesions is necessary to provide automated tools for the detection of skin cancer. High-level intuitive features (HLIF) that measure border irregularity of skin lesion images obtained with standard cameras are presented. Existing feature sets have defined many low-level unintuitive features. Incorporating HLIFs into a set of low-level features gives more semantic meaning to the feature set, and allows the system to provide intuitive rationale for the classification decision. Promising experimental results show that adding a small set of HLIFs to the large state-of-the-art low-level skin lesion feature set increases sensitivity, specificity, and accuracy, while decreasing the cross-validation error.
  • Keywords
    biomedical optical imaging; cancer; feature extraction; image classification; image enhancement; medical image processing; sensitivity; skin; classification decision; cross-validation error; intuitive rationale; low-level unintuitive feature extraction; morphological high-level intuitive feature extraction; semantic meaning; sensitivity; skin cancer detection; skin lesion classification enhancement; skin lesion images; standard cameras; Cancer; Feature extraction; Lesions; Malignant tumors; Sensitivity; Shape; Skin; Algorithms; Dermoscopy; Diagnosis, Differential; Humans; Image Interpretation, Computer-Assisted; Melanoma; Nevus; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Skin Neoplasms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4119-8
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2012.6346956
  • Filename
    6346956